Scanning Electron microscopy

Ansicht des Rasterelektronenmikroskops

The facilities for scanning electron microscopy and focused ion beam applications host a conventional tungsten filament SEM (FEI Inspect S) and a FIB-SEM instrument equipped with a field emission electron source (FEI Quanta 3D FEG). The scanning electron microscopy facilities are shared among the Earth Science departments/institutes of the Faculty of Earth Sciences, Geography and Astronomy of the University of Vienna.

FEI Inspect S

The Inspect S is our basic tool for standard electron microscopy, allowing for fast characterization of mineral, fossil and rock surfaces. The apparatus is equipped with secondary electron detectors for operation at high vacuum and low vacuum, as well as a back scattered electron detector and an energy dispersive X-ray detection unit (EDAX Apollo XV) for semi-quantitative micro-chemical analysis and a cathodoluminescence detector (Gatan ChromaCL).

For further information on the Inspect S instrument contact: