Scanning Electron microscopy

The Inspect S scanning electron microscope is operated by the Institute for Palaeontology in cooperation with the geological sub-units of the FGGA.

The facilities for scanning electron microscopy and focused ion beam applications host a conventional tungsten filament SEM (FEI Inspect S) and a FIB-SEM instrument equipped with a field emission electron source (FEI Quanta 3D FEG). The scanning electron microscopy facilities are shared among the Earth Science sub-units of the Faculty of Earth Sciences, Geography and Astronomy and the Centre for Microbiology and Environmental Systems Science of the University of Vienna.

FEI Inspect S

The Inspect S is our basic tool for standard electron microscopy, allowing for fast characterization of mineral, fossil and rock surfaces. The apparatus is equipped with secondary electron detectors for operation at high vacuum and low vacuum, as well as a back scattered electron detector and an energy dispersive X-ray detection unit (EDAX Apollo XV) for semi-quantitative micro-chemical analysis and a cathodoluminescence detector (Gatan ChromaCL).

For further information on the Inspect S instrument contact:

• Petra Heinz
• Christian Baal